Current annealing and electrical breakdown of epitaxial graphene
نویسندگان
چکیده
منابع مشابه
Epitaxial Graphene and Graphene–Based Devices Studied by Electrical Scanning Probe Microscopy
We present local electrical characterization of epitaxial graphene grown on both Siand C-faces of 4H-SiC using Electrostatic Force Microscopy and Kelvin Probe Force Microscopy in ambient conditions and at elevated temperatures. These techniques provide a straightforward identification of graphene domains with various thicknesses on the substrate where topographical determination is hindered by ...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2011
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.3592841